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Defects in SiO2 and Related Dielectrics: Science and...

Defects in SiO2 and Related Dielectrics: Science and Technology

Adrian C. Wright (auth.), G. Pacchioni, L. Skuja, D. L. Griscom (eds.)
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Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies.
This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.

Kategori:
Tahun:
2000
Edisi:
1
Penerbit:
Springer Netherlands
Bahasa:
english
Halaman:
624
ISBN 10:
9401009449
ISBN 13:
9789401009447
Nama seri:
NATO Science Series 2
File:
PDF, 27.41 MB
IPFS:
CID , CID Blake2b
english, 2000
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